Abstract：The paper presented a new index for measuring development degree of shallow mufti-refraction-slope of lines linking mufti-refraction-blind zone and created a clear relation between shallow mufti-refraction and near-surface structure,so that summed up a suit of scientific and rigid methods for testing,analyzing and optimizing acquisition data.Application of the method in seismic data acquisition in refraction-developed zone has been seen a good results.
王长春, 熊金良. 浅层多次折射发育机理与地震资料采集方法探讨[J]. 石油地球物理勘探, 2001, 36(3): 364-370.
Wang Changchun, Xiong Jinliang. Development mechanism of shallow mufti-refraction and approach to seismic data acquisition. OGP, 2001, 36(3): 364-370.
